Cale:OKDatasheet > Semiconductor Date > TI Datasheet > SN74BCT8373ADW
SN74BCT8373ADW spec.: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
Cale:OKDatasheet > Semiconductor Date > TI Datasheet > SN74BCT8373ADW
SN74BCT8373ADW spec.: IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES
Producător : TI
Ambalare : DW
Pin : 24
Temperatura : Min 0 °C | Max 70 °C
Marime : 323 KB
Cerere : IEEE STD 1149.1 (JTAG) BOUNDARY-SCAN TEST DEVICE WITH OCTAL D-TYPE LATCHES