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SN74BCT8374ADWR spec.: SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
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SN74BCT8374ADWR Datasheet şi Spec
Producător : TI
Ambalare : DW
Pin : 24
Temperatura : Min 0 °C | Max 70 °C
Marime : 323 KB
Cerere : SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
SN74BCT8374ADWR Descarca PDF
