Cale:OKDatasheet > Semiconductor Date > TI Datasheet > SNJ54BCT8373AFK
SNJ54BCT8373AFK spec.: SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
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SNJ54BCT8373AFK Datasheet şi Spec
Producător : TI
Ambalare : FK
Pin : 28
Temperatura : Min -55 °C | Max 125 °C
Marime : 323 KB
Cerere : SCAN TEST DEVICES WITH OCTAL D-TYPE LATCHES
SNJ54BCT8373AFK Descarca PDF
